JPH0223094B2 - - Google Patents
Info
- Publication number
- JPH0223094B2 JPH0223094B2 JP58192639A JP19263983A JPH0223094B2 JP H0223094 B2 JPH0223094 B2 JP H0223094B2 JP 58192639 A JP58192639 A JP 58192639A JP 19263983 A JP19263983 A JP 19263983A JP H0223094 B2 JPH0223094 B2 JP H0223094B2
- Authority
- JP
- Japan
- Prior art keywords
- comparator
- input
- node
- balanced
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
- H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
- H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
- H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- Manipulation Of Pulses (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/434,893 US4547683A (en) | 1982-10-18 | 1982-10-18 | High speed charge balancing comparator |
US434893 | 1995-05-04 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5991712A JPS5991712A (ja) | 1984-05-26 |
JPH0223094B2 true JPH0223094B2 (en]) | 1990-05-22 |
Family
ID=23726133
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58192639A Granted JPS5991712A (ja) | 1982-10-18 | 1983-10-17 | 比較器 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4547683A (en]) |
EP (1) | EP0108927B1 (en]) |
JP (1) | JPS5991712A (en]) |
DE (1) | DE3373357D1 (en]) |
Families Citing this family (29)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6248117A (ja) * | 1985-08-27 | 1987-03-02 | Mitsubishi Electric Corp | チヨツパ型比較器 |
JPH07117559B2 (ja) * | 1986-03-29 | 1995-12-18 | 株式会社東芝 | 電圧比較回路 |
US4748418A (en) * | 1986-11-12 | 1988-05-31 | Crystal Semiconductor Corporation | Quasi auto-zero circuit for sampling amplifiers |
DE3723919A1 (de) * | 1987-07-18 | 1989-01-26 | Philips Patentverwaltung | Vergleichsschaltung |
JPH03505031A (ja) * | 1988-05-06 | 1991-10-31 | マジエラン・コーポレーシヨン・(オーストラリア)・プロプライエタリイ・リミテツド | 低電力クロツク回路 |
JPH02124624A (ja) * | 1988-07-04 | 1990-05-11 | Toshiba Corp | インバータ回路及び該回路を用いたチョッパ型コンパレータ回路 |
US4926176A (en) * | 1988-08-25 | 1990-05-15 | Brooktree Corporation | Self-timing analog-to-digital converting system |
JPH02100513A (ja) * | 1988-10-07 | 1990-04-12 | Mitsubishi Electric Corp | 電圧比較装置 |
US4989003A (en) * | 1989-06-19 | 1991-01-29 | Rca Corporation | Autozeroed set comparator circuitry |
JP2972247B2 (ja) * | 1989-12-14 | 1999-11-08 | 日本電気株式会社 | スイッチト・キャパシタ型ヒステリシスコンパレータ回路 |
US5332931A (en) * | 1991-06-24 | 1994-07-26 | Harris Corporation | High speed differential comparator |
JPH0595285A (ja) * | 1991-10-03 | 1993-04-16 | Mitsubishi Electric Corp | 電圧比較器 |
GB2277162B (en) * | 1993-04-17 | 1996-08-07 | Edgcumbe Instr Limited | High voltage phasing detector |
JP3222276B2 (ja) * | 1993-07-30 | 2001-10-22 | セイコーインスツルメンツ株式会社 | コンパレータ回路およびコンパレータ回路の制御方法 |
DE69533604T2 (de) * | 1994-07-05 | 2005-02-10 | Matsushita Electric Industrial Co., Ltd., Kadoma | Verriegelungsschaltung |
US5514972A (en) * | 1994-10-20 | 1996-05-07 | International Business Machines Corporation | Voltage comparison circuit |
RU2101254C1 (ru) * | 1996-04-04 | 1998-01-10 | Акционерное общество "Спектр-Автоматика" | Состав для окрашивания строительных материалов |
JP3161598B2 (ja) * | 1998-04-30 | 2001-04-25 | 日本電気株式会社 | 半導体集積回路およびその製造方法 |
US6657487B2 (en) * | 2001-02-05 | 2003-12-02 | Em(Us) Design, Inc | Photodetector preamplifier circuit having a rotating input stage |
GB2378066B (en) | 2001-07-23 | 2005-10-26 | Seiko Epson Corp | Comparator circuit and method |
US6711513B2 (en) * | 2002-05-02 | 2004-03-23 | Ivensys Systems, Inc. | Fault tolerant apparatus and method for determining a revolution rate of a gear |
US7142030B2 (en) * | 2002-12-03 | 2006-11-28 | Semiconductor Energy Laboratory Co., Ltd. | Data latch circuit and electronic device |
US7889752B2 (en) * | 2003-06-05 | 2011-02-15 | Marvell International Ltd. | Dual ported network physical layer |
US7271641B1 (en) * | 2003-06-05 | 2007-09-18 | Marvell International Ltd. | Self-repairable semiconductor with analog switching circuit |
US6900686B1 (en) | 2003-06-05 | 2005-05-31 | Marvell International Ltd. | Analog switching circuit |
JP4694214B2 (ja) * | 2004-02-20 | 2011-06-08 | ローム株式会社 | 比較器、ad変換回路、半導体装置、および撮像装置 |
JP2012169850A (ja) * | 2011-02-14 | 2012-09-06 | Toyota Central R&D Labs Inc | チョッパ型コンパレータ |
US11742843B2 (en) * | 2020-04-23 | 2023-08-29 | Silicon Laboratories Inc. | Apparatus for offset cancellation in comparators and associated methods |
US11764759B2 (en) | 2020-04-23 | 2023-09-19 | Silicon Laboratories Inc. | Apparatus for offset cancellation in comparators and associated methods |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3676702A (en) * | 1971-01-04 | 1972-07-11 | Rca Corp | Comparator circuit |
US4028558A (en) * | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | High accuracy MOS comparator |
US4075509A (en) * | 1976-10-12 | 1978-02-21 | National Semiconductor Corporation | Cmos comparator circuit and method of manufacture |
JPS5421102A (en) * | 1977-07-18 | 1979-02-17 | Toshiba Corp | Semiconductor device circuit |
US4191900A (en) * | 1978-01-27 | 1980-03-04 | National Semiconductor Corporation | Precision plural input voltage amplifier and comparator |
US4262221A (en) * | 1979-03-09 | 1981-04-14 | Rca Corporation | Voltage comparator |
-
1982
- 1982-10-18 US US06/434,893 patent/US4547683A/en not_active Expired - Lifetime
-
1983
- 1983-10-10 DE DE8383110090T patent/DE3373357D1/de not_active Expired
- 1983-10-10 EP EP83110090A patent/EP0108927B1/en not_active Expired
- 1983-10-17 JP JP58192639A patent/JPS5991712A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
US4547683A (en) | 1985-10-15 |
EP0108927A1 (en) | 1984-05-23 |
JPS5991712A (ja) | 1984-05-26 |
DE3373357D1 (en) | 1987-10-08 |
EP0108927B1 (en) | 1987-09-02 |
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